Interface passivation by Al2O3 and SnO2 at the CdTe solar cell front contact
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Abstract
Al2O3 and SnO2 thin layers employed as the passivation layer for MgxZn1-xO(MZO)/CdTe thin-film solar cells were grown by RF magnetron sputtering. Time-resolved photoluminescence (TRPL)spectroscopy spectra show that the minority carrier lifetime of the MZO/Al2O3/CdTe structure is much longer than that of the MZO/CdTe structure, indicating that Al2O3 has a strong passivation effect on CdTe. However, the CdTe solar cells with Al2O3 as the passivation layer demonstrate serious “S-kink” in the light current density-voltage curves. The band alignment of solar cells with different passivation layer were analyzed by X-ray photoelectron spectroscopy (XPS). The large conduction band offset between Al2O3 and CdTe was found to be responsible for the “S-kink” for the solar cells with Al2O3. By controlling the thickness of the SnO2 layer, quantum size effect can be used to adjust the conduction band offset between SnO2 and CdTe, thus reducing the “S-kink” phenomenon, improving the filling factor and short-circuit current density. A solar cell with an efficiency of 9.7% has been fabricated. This study demonstrates that large conduction band offset is the main reason for the “S-kink” in the J-V curves, and that reducing the conduction band offset can effectively decrease the “S-kink” phenomenon and increase the solar cell efficiency.
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